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Sunday, May 3, 2020 | History

2 edition of 2007 Design, Automation & Test in Europe Conference & Exhibition found in the catalog.

2007 Design, Automation & Test in Europe Conference & Exhibition

Design, Automation, and Test in Europe Conference and Exhibition (2007 Nice, France)

2007 Design, Automation & Test in Europe Conference & Exhibition

Nice, France, 16-20 April 2007.

by Design, Automation, and Test in Europe Conference and Exhibition (2007 Nice, France)

  • 263 Want to read
  • 28 Currently reading

Published by IEEE in Piscataway, NJ .
Written in English

    Subjects:
  • Electronic systems -- Design and construction -- Congresses.,
  • Electronic circuit design -- Data processing -- Congresses.,
  • Computer-aided design -- Congresses.,
  • Electronic industries -- Automation -- Congresses.

  • Edition Notes

    GenreCongresses.
    ContributionsInstitute of Electrical and Electronics Engineers.
    Classifications
    LC ClassificationsTK7870 .D467 2007
    The Physical Object
    Pagination3 v. (xxvi, 1682 p.) :
    Number of Pages1682
    ID Numbers
    Open LibraryOL16921923M
    ISBN 109783981080124
    LC Control Number2006936709

    Design, Automation, and Test in Europe. 25th Asia and South Pacific Design Automation Conference. DAC is the premier conference devoted to the design and automation of electronic systems (EDA), embedded systems and software (ESS), and intellectual property (IP). The Design, Automation and Test in Europe (DATE) conference celebrated in its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year.

    Proceedings of the 53rd Annual Design Automation Conference on - DAC '16/Proceedings of the 53rd Annual Design Automation Conference on - DAC ' ; Full Text Cristoloveanu, Sorin, Wan, Jing, Zaslavsky, Alexander A Review of Sharp-Switching Devices for Ultra-Low Power Applications. Other similar conferences are the International Conference on Computer-Aided Design, or ICCAD (technical only, no trade show), Design Automation and Test in Europe (DATE), Asia and South Pacific Design Automation Conference (ASPDAC), and International Symposium on Founded: May 6, ; 55 years ago in Cambridge, .

      In: Design, automation & test in Europe conference & exhibition (Date ’15), pp – Google Scholar Cuenot P et al () Developing automotive products using the EAST-ADL2: an AUTOSAR compliant architecture description by: 3. Latest Publications. Leveraging Virtualization Extensions for Fast Virtual Platforms, in Proceedings of the Conference on Design, Automation & Test in Europe (DATE), , accepted for publication © IEEE. Guntoro, A., De La Parra, C., Next Generation Arithmetic for Edge Computing, in Proceedings of the Conference on Design.


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2007 Design, Automation & Test in Europe Conference & Exhibition by Design, Automation, and Test in Europe Conference and Exhibition (2007 Nice, France) Download PDF EPUB FB2

Each year the Design, Automation and Test in Europe Conference presents awards to the authors of the best papers. The selection is performed by the award committee composed of the Track Chairs Cristiana Bolchini, Theocharis Theocharides, Jaume Abella and Valeria Bertacco and the following members: Borzoo Bonakdarpour, Andrea Calimera, Ramon Canal, Luca Carloni, Alessandro Cimatti, Ayse.

Proceedings - Design, Automation and Test in Europe Conference and Exhibition. Country: United States - SIR Ranking of United Cites / Doc. (3 years) Cites / Doc. (3 years) (research articles, conference papers and reviews) in three year windows vs. those documents other than research articles.

Welcome to the DATE 07 Conference Proceedings. DATE combines the world's leading electronic systems design conference and Europe's leading international exhibition for electronic design, automation and test, from system level hardware and software implementation right down to integrated circuit design.

Title Design, Automation & Test in Europe Conference & Exhibition Desc:Proceedings of a meeting held AprilNice, France. Prod#:CFPPOD ISBN Pages:1, (3 Vols) Format:Softcover Notes: Authorized distributor of all IEEE proceedings TOC:View Table of Contents Publ:Institute of Electrical and Electronics Engineers (IEEE) POD Publ:Curran Associates, Inc.

DATE Best Paper Awards. Each year the Design, Automation and Test in Europe Conference presents awards to the authors of the best papers. The selection is performed by an award committee, based on the results of the reviewing process and the quality of the final paper.

Ganeshpure, KP and Kundu, S, "Automatic test pattern generation for maximal circuit noise in multiple aggressor crosstalk faults" (). DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, 2007 Design /DATECited by: Title Design, Automation & Test in Europe Desc:Proceedings of a meeting held MarchMunich, Germany.

Prod#:CFPPOD ISBN Pages:1, (3 Vols) Format:Softcover Notes: Authorized distributor of all IEEE proceedings TOC:View Table of Contents Publ:Institute of Electrical and Electronics Engineers (IEEE) POD Publ:Curran Associates, Inc. (Mar ). Lin, C., Xie, A., & Zhou, H. Design closure driven delay relaxation based on convex cost network flow.

In Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE (pp. ).Cited by: 6.

Design, Automation & Test in Europe Conference. line. 2 0% discount. Conference members are entitled to a 10% discount on ALL Springer books. Get special conference pricing until Ap Discount prices will appear at check out. Design Automation Techniques for Approximation.

Scope of the Event. The 23 rd DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems.

DATE puts strong emphasis on both technology and systems, covering ICs/SoCs, emerging technologies. Genre/Form: Conference papers and proceedings Congresses: Additional Physical Format: Print version: Design, Automation, and Test in Europe Conference and Exhibition ( Nice, France). Design, Automation & Test in Europe, or DATE is a yearly conference on the topic of electronic design is typically held in March or April of each year, alternating between France and Germany.

It is sponsored by the SIGDA of the Association for Computing Machinery, the EDA Consortium, the European Design and Automation Association (EDAA), the European Electronic Chips and Systems Conferences: ACM/IEEE Supercomputing. By M Ciesielski, S Askar, D Gomez-Prado, et al., Published on 01/01/ Journal or Book Title.

DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS Cited by: This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis.

The proposed analysis method is an alternative to histogram based analysis techniques to provide test time Cited by: Original language: English (US) Title of host publication: Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE Cited by: ABOUT DACFor 57 years, the Design Automation Conference has been recognized as the premier event on leading-edge research and practice in tools and methodologies for the design and automation of electronic systems.

DAC offers the semiconductor and electronic design industry outstanding education, training, exhibits and networking opportunities for a worldwide community of designers. T3 - Proceedings -Design, Automation and Test in Europe, DATE.

SP - EP - BT - Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE T2 - Design, Automation and Test in Europe Conference and Exhibition. Y2 - 16 April through 20 April Cited by: 3. Original language: English (US) Title of host publication: Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE Cited by: 6.

Conference Call for Papers. The 21st DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and.

Fault-Tolerant Systems. Automation & Test in Europe Conference & Exhibition, () reliability through adapting runtime task schedule based on time-correlated fault behavior Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, () Salehi M, Shafique M, Kriebel F, Rehman S, Tavana M, Ejlali.

Design, Automation & Test in Europe Conference & Exhibition (DATE) Year: Main memory organization trade-offs with DRAM and STT-MRAM options .The DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems.K.

Wang, A. Louri, A. Karanth, and R. Bunescu, "High-performance, Energy-efficient, Fault-tolerant Network-on-Chip Design Using Reinforcement Learning", in Proceedings of the Design Automation & Test in Europe Conference & Exhibition (DATE), Florence, Italy, March